Join us at SPIE AR|VR|MR 2024 as we set the standards for optical metrology testing! Visit our booth #6315 to explore our unique AR metrology systems that redefine the way you measure your waveguides and end products. Our test systems cover the entire process, ensuring the highest levels of quality and precision.
SPIE 2024
Visit us at Booth #6315
OptoFidelity Presentation at SPIE 2024
.jpg?width=544&name=spiepresentations%20(3).jpg)
Dr. Thomas Kerst, Chief of Metrology
"Improving AR metrology: cost & risk cuts via optical referencing innovation"
29th of January 2024
10:30-10:50 am
Moscone Center, Room 3006 (Level 3 West)
View Details.jpg?width=544&name=spiepresentations%20(4).jpg)
Murat Deveci, Director, Global Sales and Business
Poster session: "Accurate characterization of diffractive waveguide gratings"
29th of January 2024
5:30-7:00 pm
Moscone Center, Lobby (Level 3 West)
View Details