In this session, we’ll explore the critical role of wafer-level measurements in AR device production, highlight common challenges, and share insights from a recent case study. We’ll also discuss how these factors impact image quality, review potential solutions to mitigate issues, and look ahead at future developments.
Agenda:
- AR Glasses production flow and its connection to image quality
- The importance of wafer-level measurements and key challenges
- Case study highlights and findings
- Impact on image quality and possible solutions
This 30-minute webinar is led by Joonas Pylväinen, Product Manager at OptoFidelity.
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